| 摘要 |
<p>The arrangement for microscopic examination and/or detection of an at least partly transparent sample by means of a microscope lens provides irradiation of the sample outside of the lens at least from one side at an angle to the optical axis of the lens. The irradiation light is focussed in the sample with a smaller aperture than that of the examining lens. Independent claims are included for; (a) A microscope lens for monitoring a sample; (b) A light pattern microscope; and (c) The use of such an arrangement.</p> |
