发明名称 CHARACTERISTIC ANALYSIS DEVICE AND SUBSTRATE LAYOUT DESIGN/VERIFICATION DEVICE CONSTITUTED BY INCLUDING THE SAME
摘要 PROBLEM TO BE SOLVED: To perform characteristic analysis with sufficient accuracy and in processing time shorter than that in the conventional case after layout design of a circuit substrate and to perform efficient substrate layout design with satisfactory signal quality. SOLUTION: This characteristic analysis device performs numerical analysis of characteristics of the circuit board. The characteristic analysis device is provided with: a minuteness instruction part which instructs minuteness of the characteristic analysis; an input part which inputs circuit information regarding a circuit, a substrate layout information regarding layout of a substrate on which the circuit is mounted, and circuit/layout correspondence information regarding correspondence between the circuit and the substrate layout; a model generation part which generates a model for characteristic analysis of the circuit substrate corresponding to the minuteness instructed on the basis of the inputted circuit information, substrate layout information and circuit/layout correspondence information; a characteristic analysis part which performs the characteristic analysis using the generated model for the characteristic analysis of the circuit substrate; and an output part which outputs an analysis result. The characteristic analysis device outputs the analysis result of the minuteness in accordance with the instruction of the minuteness instruction part. In addition, a substrate layout design/verification device constituted by comprising the characteristic analysis device is used. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006012047(A) 申请公布日期 2006.01.12
申请号 JP20040191494 申请日期 2004.06.29
申请人 SHARP CORP 发明人 KISO TATSURO
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址