发明名称 SEMICONDUCTOR MANUFACTURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To provide an exposure device which can reduce a down time of the exposure device by cleaning a reticle chuck surface automatically. <P>SOLUTION: A tool for cleaning a reticle chuck surface by using either a reticle carrying device or a reticle exchange device is carried, and the reticle chuck surface is cleaned by using the tool. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006013308(A) 申请公布日期 2006.01.12
申请号 JP20040191290 申请日期 2004.06.29
申请人 CANON INC 发明人 ISOYAMA HIROSHI
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
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