发明名称 METHOD OF OPERATING A PROCESSING SYSTEM FOR TREATING A SUBSTRATE
摘要 <p>A method and system are described for operating a processing system in order to optimize throughput. The processing system is configured for chemical oxide removal, wherein the processing system includes a process chamber having a lower chamber portion configured to chemically treat a substrate and an upper chamber portion configured to thermally treat the substrate, and a substrate lifting assembly configured to transport the substrate between the lower chamber portion and the upper chamber portion.</p>
申请公布号 WO2005122215(A1) 申请公布日期 2005.12.22
申请号 WO2005US15928 申请日期 2005.05.06
申请人 TOKYO ELECTRON LIMITED;KENT, MARTIN 发明人 KENT, MARTIN
分类号 H01L21/00;H01L21/677;(IPC1-7):H01L21/00 主分类号 H01L21/00
代理机构 代理人
主权项
地址