| 摘要 |
PROBLEM TO BE SOLVED: To provide an optical signal waveform measurement/evaluation apparatus which performs observation and quality monitoring of an optical signal waveform with less SNR deterioration by optoelectric sampling means, high sensitivity, and a wide range of measurement wavelength. SOLUTION: The optical signal waveform measurement/evaluation apparatus comprises sampling clock generation means 100 which generates and outputs an electric sampling clock of a predetermined repetition frequency f<SB>1</SB>, optoelectric sampling means 102 which repeats an optical signal of a bit rate of f<SB>0</SB>and outputs a sampling optical signal obtained by sampling with the electric sampling clock of the frequency f<SB>1</SB>, optoelectric conversion means 104 which converts the sampling optical signal into a sampling electric signal and outputs it, and electric signal processing means 106 which determines an optical signal waveform or an optical signal quality parameter from the sampling electric signal, wherein a semiconductor optical amplifier is used as the optoelectric sampling means 102. COPYRIGHT: (C)2006,JPO&NCIPI
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