发明名称 Method of forming an element of a microelectronic circuit
摘要 A method is described for forming an element of a microelectronic circuit. A sacrificial layer is formed on an upper surface of a support layer. The sacrificial layer is extremely thin and uniform. A height-defining layer is then formed on the sacrificial layer, whereafter the sacrificial layer is etched away so that a well-defined gap is left between an upper surface of the support layer and a lower surface of the height-defining layer. A monocrystalline semiconductor material is then selectively grown from a nucleation silicon site through the gap. The monocrystalline semiconductor material forms a monocrystalline layer having a thickness corresponding to the thickness of the original sacrificial layer.
申请公布号 US6972228(B2) 申请公布日期 2005.12.06
申请号 US20030387623 申请日期 2003.03.12
申请人 INTEL CORPORATION 发明人 DOYLE BRIAN S.;MURTHY ANAND S.;CHAU ROBERT S.
分类号 H01L21/20;H01L29/12;H01S5/34;(IPC1-7):H01L21/824 主分类号 H01L21/20
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