| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To obtain a multilayer circuit board which can detect the amount of the deviation of a specific layer by measuring the electrical characteristics of a high frequency circuit pattern for detecting the layer deviation in the substrate of a multilayer configuration. <P>SOLUTION: The multilayer circuit substrate having the circuit substrate made of a multilayer configuration includes a resonance circuit (105, 106, and 115) of the configuration that the conductor pattern of the specific layer and the conductor pattern of the other layer formed by dividing, when the specific layer is deviated in a specific direction, a resonance frequency changes, and when it shifts in the direction which is not parallel to the opposite direction or the specific direction; and a high frequency wave circuit pattern having input/output terminals (123, 124) provided in the outermost layer. <P>COPYRIGHT: (C)2006,JPO&NCIPI</p> |
