发明名称 RRAM circuit with temperature compensation
摘要 A temperature compensated RRAM sensing circuit to improve the RRAM readability against temperature variations is disclosed. The circuit comprises a temperature dependent element to control the response of a temperature compensated circuit to generate a temperature dependent signal to compensate for the temperature variations of the resistance states of the memory resistors. The temperature dependent element can control the sensing signal supplied to the memory resistor so that the resistance states of the memory resistor are compensated against temperature variations. The temperature dependent element can control the reference signal supplied to the comparison circuit so that the output signal provided by the comparison circuit is compensated against temperature variations. The temperature dependent element is preferably made of the same material and process as the memory resistors.
申请公布号 US6967884(B2) 申请公布日期 2005.11.22
申请号 US20050031321 申请日期 2005.01.05
申请人 SHARP LABORATORIES OF AMERICA, INC. 发明人 HSU SHENG TENG
分类号 G11C13/02;G11C7/04;G11C7/06;G11C7/14;G11C11/56;G11C13/00;G11C16/02;H01L27/10;(IPC1-7):G11C7/04 主分类号 G11C13/02
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