发明名称 ELECTRIC CHARACTERISTIC INSPECTION METHOD OF ELECTRONIC COMPONENT, AND ELECTRIC CHARACTERISTIC INSPECTION DEVICE OF ELECTRONIC COMPONENT OF AUTOMATIC FINISHING MACHINE
摘要 PROBLEM TO BE SOLVED: To solve the problem wherein there is no inspection method capable of inspecting an inspection item requiring a long inspection time without lowering the mass production efficiency of an automatic finishing machine of an electronic component. SOLUTION: A holding means 14 for holding a plurality of electronic components 12 is sent successively to a waiting station C and waits. For example, when six holding means are waiting, the six holding means are transferred simultaneously from the waiting station C to an inspection station D, and preceding six holding means holding inspected electronic components 12 are transferred simultaneously from the inspection station D to an evacuation station E. Electric characteristics of the plurality of electronic components 12 on the six holding means 14 transferred from the waiting station C to the inspection station D are inspected simultaneously by inspection units 16. During inspection in the inspection station D, the next holding means 14 is sent successively to the waiting station C, and the preceding holding means holding the inspected electronic components 12 is sent out successively from the evacuation station E. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005321232(A) 申请公布日期 2005.11.17
申请号 JP20040137817 申请日期 2004.05.06
申请人 HI-MECHA CORP 发明人 WATABE TERUHIDE
分类号 G01R31/00;(IPC1-7):G01R31/00 主分类号 G01R31/00
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