发明名称 System and method for analyzing a waveform to detect specified patterns
摘要 Disclosed are techniques for analyzing waveforms to determine the existence of certain patterns in those waveforms. The existence of certain patterns can be used by investors to make decisions regarding the purchase or sale of stocks. The processes include a determination of the formation of a base, whether the pattern formed in the base is a cup or saucer, whether there is a double bottom in the base, if a base has broken out and if a handle exists on a cup, as well as other patterns.
申请公布号 US2005256703(A1) 申请公布日期 2005.11.17
申请号 US20050129564 申请日期 2005.05.13
申请人 MARKEL STEVEN O 发明人 MARKEL STEVEN O.
分类号 G06Q40/00;G10L21/00;(IPC1-7):G10L21/00 主分类号 G06Q40/00
代理机构 代理人
主权项
地址
您可能感兴趣的专利