发明名称 Semiconductor device and method of fabricating the same
摘要 A semiconductor device includes a semiconductor substrate, a plurality of memory cell transistors and select gate transistors both formed in a memory cell region of the semiconductor substrate, and a transistor formed in a peripheral circuit region of the substrate and having a high breakdown voltage. Each select gate transistor of the memory cell region has a gate electrode under which an ion implanted layer is formed for adjustment of a threshold. The transistor having the high breakdown voltage includes a contact region around which a gate insulation film remains.
申请公布号 US2005253202(A1) 申请公布日期 2005.11.17
申请号 US20050126285 申请日期 2005.05.11
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 KAMIYA EIJI;IIZUKA HIROHISA;HAZAMA HIROAKI;NARITA KAZUHITO;OHTANI NORIO
分类号 H01L21/8234;H01L21/265;H01L21/60;H01L21/768;H01L21/8242;H01L21/8247;H01L27/088;H01L27/10;H01L27/115;H01L29/04;H01L29/788;H01L29/792;(IPC1-7):H01L29/04 主分类号 H01L21/8234
代理机构 代理人
主权项
地址