| 摘要 |
<p>A system and method of monitoring LCD production yields, predicting the effects of different testing methodologies on LCD production yields, optimizing production yields, and detecting defects in TFT-array panels is provided that compares the effect of different testing methodologies on the yields at various stages in the LCD testing and assembly process. The present invention can also be used to predict the effect of different testing methodologies on user- defined parameters, such as profit. The present invention can also detect defects in TFT-array panels with improved defect detection accuracy.</p> |
