发明名称 Projection optic system especially for photolithography for semiconductor processing has a filter with opaque and transmitting regions to provide an optimum intensity distribution for the projection
摘要 <p>A projection optic system for producing fine detail images, e.g. for photolithography for the production of semiconductors, integrated circuits etc., has the beam modulated by a filter (1) with a pattern of opaque and transmitting areas. The invention describes additional areas which are partially transmitting. The filter has a quartz substrate (40) which a has thick coating (42) as non transmitting areas as well as a thinner (48) layer for partial transmission and cleared areas (46) for non restricted.</p>
申请公布号 DE102004019595(A1) 申请公布日期 2005.11.10
申请号 DE20041019595 申请日期 2004.04.22
申请人 INFINEON TECHNOLOGIES AG 发明人 LESCHOK, ANDRE;VERHOEVEN, MARTIN;BRATT, GARY
分类号 G03B9/02;G03F7/20;(IPC1-7):G03F7/20 主分类号 G03B9/02
代理机构 代理人
主权项
地址
您可能感兴趣的专利