发明名称 |
APPARATUS, METHOD AND PROGRAM PRODUCT FOR SUPPRESSING WAVINESS OF FEATURES TO BE PRINTED BY USING PHOTOLITHOGRAPHIC SYSTEMS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a method for minimizing variation of features when imaged on a surface of a substrate by using a mask. <P>SOLUTION: The method includes the steps of determining a deviation between a first representation of the design and a second representation of an image of the design at each of a plurality of evaluation points for each section of a plurality of sections of the design; determining an amount of modification of the design at each section based on an evaluation of the plurality of evaluation points; and modifying the design at each section by the amount determined in the previous step. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
申请公布号 |
JP2005316486(A) |
申请公布日期 |
2005.11.10 |
申请号 |
JP20050130357 |
申请日期 |
2005.03.31 |
申请人 |
ASML MASKTOOLS BV |
发明人 |
MARKUS FRANCISCUS ANTONIUS EURLINGS;MULDER MELCHIOR;LAIDIG THOMAS;HOLLERBACH UWE |
分类号 |
G03F1/00;G03F1/36;G03F7/20;G06F17/50;H01L21/027 |
主分类号 |
G03F1/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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