| 摘要 |
The invention relates to a method for the contactless measurement of an object (6) in at least one dimension. According to said method, the object (6) is scanned in a spatially restricted effective zone of a scanning beam field (1) and the size of the object (6) in terms of the measured dimension is deduced by the detection of one or more interruptions in the scanning beams (L). The scanning beam field (1) is constructed from a number of directly addressable individual beams (L). The beam-assisted scanning of the spatially restricted effective zone of the scanning beam field (1) is carried out according to a predefinable pattern of steps, using a non- linear sorting method. A preferred method uses binary location.
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