发明名称 |
AD CONVERTER MEASURING CIRCUIT |
摘要 |
PROBLEM TO BE SOLVED: To provide an AD converter measuring circuit capable of using an LSI tester that does not need a DC measuring unit to perform a test in short period of time in testing an AD converter. SOLUTION: This AD converter measuring circuit is provided with a DA converter 204 for converting a digital signal into an analog signal and inputting the analog signal to an AD converter 102 of a measuring object, a counter 208 for generating an expected value of an output of the AD converter 102, and an EX-OR gate 211 and a flip-flop 212 for comparing an actual measured value being the output of AD converter 102 with the expected value being an output of the counter 208 and outputting a comparison result. In addition, the AD converter measuring circuit has an accuracy correction circuit 401 consisting of a flip-flop 402 for shifting a signal of the comparison result and an AND gate 404 for receiving the comparison result and an output of the flip-flop 402. COPYRIGHT: (C)2006,JPO&NCIPI
|
申请公布号 |
JP2005303602(A) |
申请公布日期 |
2005.10.27 |
申请号 |
JP20040115481 |
申请日期 |
2004.04.09 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
OO KINYA;SHINOMIYA SHIGERU |
分类号 |
G01R31/316;H03M1/10;(IPC1-7):H03M1/10 |
主分类号 |
G01R31/316 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|