发明名称 |
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF |
摘要 |
<p>A semiconductor device and a manufacturing method thereof are provided so as to prevent electrical resistance of a source/drain region from increasing and prevent impurities from diffusing from a semiconductor film and a side wall. The semiconductor device is provided with a semiconductor substrate (1), a gate structure (2), a source/drain region (41), a first diffusion preventing film (8) and a side wall (7). In the gate structure (2), an insulating film (21), a second diffusion preventing film (22) and a semiconductor film (23) are stacked in this order. The semiconductor film (23) includes an impurity. The first diffusion preventing film (8) covers a side plane of the gate structure (2), and covers the semiconductor substrate (1), exposing at least a part of the source/drain region (41). The side wall (7) covers the first diffusion preventing film (8) while being in contact with the source/drain region (41).</p> |
申请公布号 |
WO2005101520(A1) |
申请公布日期 |
2005.10.27 |
申请号 |
WO2005JP06761 |
申请日期 |
2005.04.06 |
申请人 |
RENESAS TECHNOLOGY CORP.;AKAMATSU, YASUHIKO;SON, SAIFON;TSUJIKAWA, SHINPEI |
发明人 |
AKAMATSU, YASUHIKO;SON, SAIFON;TSUJIKAWA, SHINPEI |
分类号 |
H01L21/336;H01L29/78;(IPC1-7):H01L29/78 |
主分类号 |
H01L21/336 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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