发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 <p>A semiconductor device and a manufacturing method thereof are provided so as to prevent electrical resistance of a source/drain region from increasing and prevent impurities from diffusing from a semiconductor film and a side wall. The semiconductor device is provided with a semiconductor substrate (1), a gate structure (2), a source/drain region (41), a first diffusion preventing film (8) and a side wall (7). In the gate structure (2), an insulating film (21), a second diffusion preventing film (22) and a semiconductor film (23) are stacked in this order. The semiconductor film (23) includes an impurity. The first diffusion preventing film (8) covers a side plane of the gate structure (2), and covers the semiconductor substrate (1), exposing at least a part of the source/drain region (41). The side wall (7) covers the first diffusion preventing film (8) while being in contact with the source/drain region (41).</p>
申请公布号 WO2005101520(A1) 申请公布日期 2005.10.27
申请号 WO2005JP06761 申请日期 2005.04.06
申请人 RENESAS TECHNOLOGY CORP.;AKAMATSU, YASUHIKO;SON, SAIFON;TSUJIKAWA, SHINPEI 发明人 AKAMATSU, YASUHIKO;SON, SAIFON;TSUJIKAWA, SHINPEI
分类号 H01L21/336;H01L29/78;(IPC1-7):H01L29/78 主分类号 H01L21/336
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