首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
METHOD AND APPARATUS FOR CALIBRATING A TEMPERATURE PROBE IN A THERMAL PROCESSING SYSTEM
摘要
申请公布号
KR100512191(B1)
申请公布日期
2005.10.21
申请号
KR19970011025
申请日期
1997.03.28
申请人
发明人
分类号
C21D1/00;(IPC1-7):C21D1/00
主分类号
C21D1/00
代理机构
代理人
主权项
地址
您可能感兴趣的专利
FIXING METHOD FOR SANDWICH PANEL
PACKING MATERIAL, INITIAL-DETERIORATION METHOD, AND TRANSPORT METHOD FOR SOLAR CELL MODULE
PORTABLE BODY ABNORMALITY REPORTING DEVICE
EXHAUST EMISSION CONTROL DEVICE OF INTERNAL COMBUSTION ENGINE
UNIAXIAL DRIVE DEVICE
LASER BEAM MACHINING DEVICE
IMAGE FORMED OBJECT SHEET CONVEYING DEVICE IN IMAGE FORMING DEVICE
CARRIER ROLLER AND ROLLER DETACHING METHOD
SHEET SUPPLY DEVICE FOR FORMING IMAGE AND IMAGE FORMING DEVICE
OPERATION OF VERTICAL FURNACE
METHOD FOR RECOVERY OF BLOWN AIR
ANAEROBIC TREATING METHOD
ANAEROGIC TREATING DEVICE
PUTTER TYPE GOLF CLUB
HYDRAULIC PISTON FOR DISK BRAKE
AIR BLOWING DEVICE FOR FLUE GAS DESULFURIZATION EQUIPMENT
METHOD FOR MOLDING COMPOSITE MATERIAL AND MOLDING DEVICE
THERMOPLASTIC RESIN-CLAD ALUMINUM OR ALUMINUM ALLOY PLATE, AND MANUFACTURE THEREOF
CABLE CONNECTION WORKBENCH
WIRING DUCT FOR DESK
