发明名称 Surface treatment of metal interconnect lines
摘要 Methods and apparatus for forming a semiconductor structure comprising a first layer on top of a substrate wherein the first layer defines conductive regions such as copper interconnect lines and non-conductive regions such as dielectric materials. The conductive regions are covered by a second layer of a material different than the first layer such as for example nickel and then the structure is heat treated such that the interconnect lines and second metal, such as a copper interconnect line and a nickel second layer, interact with each other to form an alloy layer. The alloy layer has superior qualities for adhering to both the copper interconnect lines and a subsequently deposited dielectric material.
申请公布号 US6955984(B2) 申请公布日期 2005.10.18
申请号 US20030439358 申请日期 2003.05.16
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WAN WEN-KAI;LIN YIH-HSIUNG;LEI MING-DAI;PERNG BAW-CHING;LIN CHENG-CHUNG;LIN CHIA-HUI;LIU AI-SEN
分类号 H01L21/288;H01L21/44;H01L21/445;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/288
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