| 摘要 |
PROBLEM TO BE SOLVED: To provide a solid state imaging device capable of obtaining an EVF image while performing high speed block reading for AF/AE simultaneously. SOLUTION: The solid state imaging device comprises pixel regions consisting of a plurality of pixels C11-C14, a first vertical scanning circuit 21A and first and second horizontal scanning circuits 22A and 22B capable of block reading and decimation reading, a first horizontal signal line 23A outputting pixel groups decimated from all pixel regions by the first vertical scanning circuit and the first horizontal scanning circuit as a voltage signal read out as a signal for EVF, and a second horizontal signal line 23B outputting an addition current signal read out, as a signal for AF/AE in the central block region of the pixel region, by the first vertical scanning circuit and the second horizontal scanning circuit. COPYRIGHT: (C)2006,JPO&NCIPI
|
