发明名称 OHMIC ELECTRODE STRUCTURE, MANUFACTURING METHOD THEREOF, SEMICONDUCTOR MANUFACTURING DEVICE, AND SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method of an ohmic electrode structure which is advantageous to microfabrication and can prevent resist contamination, an ohmic electrode structure, a semiconductor manufacturing device, and a semiconductor device. SOLUTION: The ohmic electrode structure is provided with a high concentration impurity region 2 selectively formed on the surface of a SiC substrate 1, a thick insulating layer 3 laid on the SiC substrate 1, a contact window 4 by which an opening is formed so that the surface of the high concentration impurity region 2 is exposed into the thick insulating layer 3, a heating reaction layer 5 formed in the contact window 4 at the inner bottom in self alignment, and a wiring conductor 6 contacted with the surface of the heating reaction layer 5 in the contact window 4 and extended to the upper part of the thick insulating layer 3. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2005276978(A) 申请公布日期 2005.10.06
申请号 JP20040086200 申请日期 2004.03.24
申请人 NISSAN MOTOR CO LTD 发明人 TANIMOTO SATOSHI
分类号 H01L21/28;H01L21/336;H01L21/338;H01L29/12;H01L29/739;H01L29/78;H01L29/812;(IPC1-7):H01L21/28 主分类号 H01L21/28
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