| 摘要 |
A method and apparatus of temperature compensation for an integrated circuit using on-chip circuits, sensors, and a calibration algorithm. The chip includes an on-chip reference circuit (12), an on-chip sensor (26) measuring a parameter relative to the reference, and an on-chip computation means (18) for processing an algorithm. A supplemental off-chip reference circuit (16) is also used. The algorithm carries out the following steps: (A) performing a first calibration of an internal reference residing in an integrated circuit system on-chip at a first (higher) temperature at a first testing site, and (B) utilizing calibration data obtained at the step (A) to perform a second calibration of the internal reference source residing on the integrated system on-chip at a second (lower) temperature at a second testing site. |
