发明名称 |
SEMICONDUCTOR DEVICE HAVING DAMASCENE STRUCTURE PROVIDED WITH AIR-GAP AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a low-cost manufacturing method for a semiconductor device having Damascene structure provided with an air-gap. SOLUTION: The manufacturing method comprises steps of: providing a flat layer M1 including a first metal layer, adhering a route level dielectric material layer VL; processing a pattern of the route level dielectric material layer VL; partially etching the route level dielectric material layer VL; adhering a disposable layer PR on the partially etched route level dielectric material layer VL; processing a pattern of the disposable layer PR; adhering a second metal layer M2, flattening the second metal layer M2; adhering a permeable dielectric material layer PDL after flattening the second metal layer M2; and removing the disposable layer PR through the permeable dielectric material layer PDL in order to form an air gap AG. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2005268794(A) |
申请公布日期 |
2005.09.29 |
申请号 |
JP20050073084 |
申请日期 |
2005.03.15 |
申请人 |
INTERUNIV MICRO ELECTRONICA CENTRUM VZW;KONINKL PHILIPS ELECTRONICS NV |
发明人 |
DAAMEN ROEL;VERHEIJDEN GREJA JOHANNA ADRIANA MARIA |
分类号 |
H01L21/4763;H01L21/768;H01L23/522;(IPC1-7):H01L21/768 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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