Systems for testing a plurality of circuit devices

摘要

A test system that tests first through m-th circuit devices for defects. The test system includes a controller and first through m-th control circuits. The controller is configured to generate a test signal having information for testing first through m-th circuit devices. The first through m-th control circuits are each configured to test a respective one of the first through m-th circuit devices for a defect using the test signal, and to stop testing the respective one of the first through m-th circuit devices when a defect is identified.