发明名称 STAGE APPARATUS AND PROJECTION EXPOSURE APPARATUS
摘要 <p>A stage apparatus capable of suppressing influence on optical position measurement caused by a heat source of a stage. The stage device has a supporting base (17X) for holding an object and movable in at least one predetermined direction, a reflection surface (18X) fixed to the supporting base and reflecting a light flux for position measurement, the light flux being projected from the rear when the supporting base moves in the predetermined direction, and a cowl section (19) fixed to the supporting base and having a surface shape baffling an airflow occurring in a space behind the reflection plate when the supporting base moves in the predetermined direction. The baffled airflow (orderly airflow) prevents entrainment of a high-temperature gas present in the lower part of the supporting base.</p>
申请公布号 WO2005083758(A1) 申请公布日期 2005.09.09
申请号 WO2005JP03395 申请日期 2005.03.01
申请人 NIKON CORPORATION;SASAKI, TAKESHI;TAKAHASHI, SATOSHI;HAGIWARA, SHIGERU 发明人 SASAKI, TAKESHI;TAKAHASHI, SATOSHI;HAGIWARA, SHIGERU
分类号 G03F7/20;G12B5/00;H01L21/027;H01L21/68;(IPC1-7):H01L21/027 主分类号 G03F7/20
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