发明名称 Non-volatile memory with a single transistor and resistive memory element
摘要 Non-volatile memory cell with a single semiconductor device per memory cell. The present invention generally allows for a plurality of memory cells to be formed on a semiconductor substrate that supports a semiconductor device. A multi-resistive state material layer that changes its resistive state between a low resistive state and a high resistive state upon application of a voltage pulse is formed above the substrate, generally at a very high temperature. While the layers fabricated between the substrate and the multi-resistive state material use materials that can withstand high temperature processing, the layers fabricated above the multi-resistive state material do not need to withstand high temperature processing.
申请公布号 US2005195632(A1) 申请公布日期 2005.09.08
申请号 US20050061101 申请日期 2005.02.18
申请人 UNITY SEMICONDUCTOR CORPORATION 发明人 RINERSON DARRELL;CHEVALLIER CHRISTOPHE J.
分类号 G11C11/56;G11C13/00;G11C16/02;H01L21/8246;H01L27/115;H01L27/24;H01L45/00;(IPC1-7):G11C11/00 主分类号 G11C11/56
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