发明名称 Exposure apparatus and method
摘要 A production method of a semiconductor device which includes the steps of exposing a resist coated on a substrate of a semiconductor device by projecting a light pattern on the substrate of the semiconductor device through an object lens, developing the resist exposed by the light pattern to form a wafer pattern with the resist, and etching the substrate on which the wafer pattern with the resist is formed. In the step of exposing, the light pattern projected on the substrate is formed by excimer laser light which is emitted from an annular shaped light source and which is passed through a mask having a phase shifter.
申请公布号 US2005191583(A1) 申请公布日期 2005.09.01
申请号 US20050117492 申请日期 2005.04.29
申请人 NOGUCHI MINORI;KENBO YUKIO;OSHIDA YOSHITADA;SHIBA MASATAKA;YOSHITAKA YASUHIRO;MURAYAMA MAKOTO 发明人 NOGUCHI MINORI;KENBO YUKIO;OSHIDA YOSHITADA;SHIBA MASATAKA;YOSHITAKA YASUHIRO;MURAYAMA MAKOTO
分类号 G03F1/08;G03F1/84;G03F7/20;H01L21/027;H01L21/30;(IPC1-7):G03F7/00 主分类号 G03F1/08
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