发明名称 Delay lock circuit having self-calibrating loop
摘要 A delay lock circuit includes a measuring path, a forward path, and a feedback path. The measuring path samples a pulse with a reference signal in a measurement to obtain a measured delay. The forward path delays the reference signal based on the measured delay to generate an internal signal. The feedback path includes a calibrating unit for generating the pulse based on a plurality of feedback signals generated from the reference signal. The delay lock circuit further includes a monitoring unit for monitoring the measurement. Based on the monitoring, the monitoring unit enables the calibrating unit to conditionally adjust the width of the pulse.
申请公布号 US2005184739(A1) 申请公布日期 2005.08.25
申请号 US20040782577 申请日期 2004.02.19
申请人 MICRON TECHNOLOGY, INC. 发明人 LIN FENG
分类号 G01R23/175;G01R31/30;G01R31/317;G01R35/00;(IPC1-7):G01R35/00 主分类号 G01R23/175
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