发明名称 Wet-etching device for photo-electrochemical wet-etching and/or gauging a semiconductor test item has a light window, an electrochemical cell, a seal ring, sources of light and a camera
摘要 <p>Fitted with a light window (LW) (16), an electrochemical cell (2) contains an electrolyte liquid (6). A seal ring (10) opposite the LW isolates a contact surface (CS) (14) on a semiconductor test item (STI) (12). A first (18) source of light (SOL) executes wet-etching/gauging of the STI. A second SOL (38) outside the center of the LW illuminates and monitors the CS.</p>
申请公布号 DE202005007710(U1) 申请公布日期 2005.08.25
申请号 DE20052007710U 申请日期 2005.05.11
申请人 WOLFF THOMAS 发明人
分类号 H01L21/3063;H01L21/66;(IPC1-7):H01L21/306 主分类号 H01L21/3063
代理机构 代理人
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