摘要 |
A method of detecting a failure in an IC, based on spectrum which is a result of analyzing a frequency of a current running through an IC when a test signal is applied to the IC, including (a) assuming that all ICs under test define a under-test IC set, and testing each one of the ICs in the under-test IC set in a conventional manner; (b) removing ICs judged to be in failure in (a), from the under-test IC set; (c) measuring spectrum of a current supplied from a power source into each one of the ICs in the under-test IC set; (d) calculating both a mean value and standard deviation of the spectrum for the under-test IC set; (e) judging whether an IC is in failure, based on both the mean value and the standard deviation of the spectrum; (f) removing ICs judged to be in failure in (e), from the under-test IC set; and (g) judging the undertest IC set to be in no failure.
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