Method and apparatus for selecting test point nodes for limited access circuit test,申请号EP19990118411-传众专利搜索

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发明名称	Method and apparatus for selecting test point nodes for limited access circuit test
摘要
申请公布号	EP0994360(B1)	申请公布日期	2005.08.10
申请号	EP19990118411	申请日期	1999.09.16
申请人	AGILENT TECHNOLOGIES, INC. (A DELAWARE CORPORATION)	发明人	AHRIKENCHEIKH, CHERIF;BROWEN, RODNEY A.;DARBIE, WILLIAM P.;MCDERMID, JOHN E.;LANNEN, KAY C.
分类号	G01R31/28;G01R31/3185;(IPC1-7):G01R31/318	主分类号	G01R31/28
代理机构		代理人
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