发明名称 |
METHOD FOR PROCESSING NITRIDE SEMICONDUCTOR CRYSTAL SURFACE AND NITRIDE SEMICONDUCTOR CRYSTAL OBTAINED BY SUCH METHOD |
摘要 |
A method of processing a surface of a nitride semiconductor crystal, wherein a surface of a nitride semiconductor crystal (11) is brought into contact with a liquid containing at least Na, Li or Ca as a processing solution (15). In the method, the processing solution (15) can be a liquid containing at least Na, having an Na content of 5-95 mol%. The processing solution (15) can be a liquid containing at least Li, having an Li content of 5-100 mol%. A nitride semiconductor crystal having a maximum depth of a surface scratch of at most 0.01 mu m or an average thickness of a damaged layer of at most 2 mu m. Consequently, a method of processing a surface of a nitride semiconductor crystal with a decreased depth of a surface scratch or a decreased thickness of a damaged layer, and a nitride semiconductor crystal obtained with the method can be provided. <IMAGE>
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申请公布号 |
EP1560261(A1) |
申请公布日期 |
2005.08.03 |
申请号 |
EP20040735986 |
申请日期 |
2004.06.03 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD.;MORI, YUSUKE |
发明人 |
NAKAHATA, SEIJI;HIROTA, RYU;ISHIBASHI, KEIJI;SASAKI, TAKATOMO;MORI, YUSUKE |
分类号 |
C30B29/38;C30B29/40;C30B33/00;C30B33/10;H01L21/306;(IPC1-7):H01L21/306 |
主分类号 |
C30B29/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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