发明名称 METHOD FOR PROCESSING NITRIDE SEMICONDUCTOR CRYSTAL SURFACE AND NITRIDE SEMICONDUCTOR CRYSTAL OBTAINED BY SUCH METHOD
摘要 A method of processing a surface of a nitride semiconductor crystal, wherein a surface of a nitride semiconductor crystal (11) is brought into contact with a liquid containing at least Na, Li or Ca as a processing solution (15). In the method, the processing solution (15) can be a liquid containing at least Na, having an Na content of 5-95 mol%. The processing solution (15) can be a liquid containing at least Li, having an Li content of 5-100 mol%. A nitride semiconductor crystal having a maximum depth of a surface scratch of at most 0.01 mu m or an average thickness of a damaged layer of at most 2 mu m. Consequently, a method of processing a surface of a nitride semiconductor crystal with a decreased depth of a surface scratch or a decreased thickness of a damaged layer, and a nitride semiconductor crystal obtained with the method can be provided. <IMAGE>
申请公布号 EP1560261(A1) 申请公布日期 2005.08.03
申请号 EP20040735986 申请日期 2004.06.03
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD.;MORI, YUSUKE 发明人 NAKAHATA, SEIJI;HIROTA, RYU;ISHIBASHI, KEIJI;SASAKI, TAKATOMO;MORI, YUSUKE
分类号 C30B29/38;C30B29/40;C30B33/00;C30B33/10;H01L21/306;(IPC1-7):H01L21/306 主分类号 C30B29/38
代理机构 代理人
主权项
地址