发明名称 SCATTER MEASUREMENT METHOD, SCATTER CORRECTION METHOD, AND X-RAY CT APPARATUS
摘要 For the purpose of correcting scatter in multi-slice imaging, a projection p and a scatter correction factor R(d, do) are stored in association with each other, a projection p is determined from data D0 collected by imaging a subject with an X-ray beam with a beam thickness d using a detector with a detector thickness do, the scatter correction factor R(d, do) associated with the projection p is determined, and the data D0 is multiplied by the scatter correction factor R(d, do) to obtain scatter-corrected data D1. <IMAGE>
申请公布号 KR20050072690(A) 申请公布日期 2005.07.12
申请号 KR20050001069 申请日期 2005.01.06
申请人 GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY, LLC 发明人 NUKUI MASATAKE
分类号 A61B6/00;A61B6/02;A61B6/03;A61B6/06;G01N23/04;G01T1/29;(IPC1-7):A61B6/03 主分类号 A61B6/00
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