发明名称 Method and device for investigation of a surface layer
摘要 A method and device for investigation of a surface layer of a material. The material without surface layer is exposed for a gas and the penetration of the gas into the material is measured. Then the surface layer is applied to the material. Finally, the material including the surface layer is exposed for the gas and the penetration of the gas into the material through the surface layer is measured. The measurement of the passage of the gas into the material is performed by a method comprising measurement of light absorption by the gas by absorption epsctroscopy.
申请公布号 US2005148092(A1) 申请公布日期 2005.07.07
申请号 US20040979082 申请日期 2004.11.02
申请人 SVANBERG SUNE;SJOHOLM MIKAEL;SOMES-FALEAN GABRIEL 发明人 SVANBERG SUNE;SJOHOLM MIKAEL;SOMES-FALEAN GABRIEL
分类号 G01N7/04;G01N7/10;G01N15/08;G01N21/31;(IPC1-7):G01N21/00 主分类号 G01N7/04
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