发明名称 |
Method and device for investigation of a surface layer |
摘要 |
A method and device for investigation of a surface layer of a material. The material without surface layer is exposed for a gas and the penetration of the gas into the material is measured. Then the surface layer is applied to the material. Finally, the material including the surface layer is exposed for the gas and the penetration of the gas into the material through the surface layer is measured. The measurement of the passage of the gas into the material is performed by a method comprising measurement of light absorption by the gas by absorption epsctroscopy.
|
申请公布号 |
US2005148092(A1) |
申请公布日期 |
2005.07.07 |
申请号 |
US20040979082 |
申请日期 |
2004.11.02 |
申请人 |
SVANBERG SUNE;SJOHOLM MIKAEL;SOMES-FALEAN GABRIEL |
发明人 |
SVANBERG SUNE;SJOHOLM MIKAEL;SOMES-FALEAN GABRIEL |
分类号 |
G01N7/04;G01N7/10;G01N15/08;G01N21/31;(IPC1-7):G01N21/00 |
主分类号 |
G01N7/04 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|