发明名称 Method of fabricating bottom gate type organic thin film transistor
摘要 A method of fabricating a bottom gate type organic thin film transistor is provided. The method includes the acts of: forming a gate conductive layer pattern on a substrate; forming a gate insulating layer on an exposed portion of the surface of the substrate and the gate conductive layer pattern; forming source/drain electrodes on the gate insulating layer to expose a portion of the surface of the gate insulating layer above on the gate conductive layer pattern; forming an organic semiconductor thin film on the exposed portion of the gate insulating layer; forming on the organic semiconductor thin film a passivation layer pattern exposing a portion of the surface of the organic semiconductor thin film; and forming an organic semiconductor thin film pattern by etching the exposed surface of the organic semiconductor thin film using the passivation layer pattern as an etch mask.
申请公布号 US2005142496(A1) 申请公布日期 2005.06.30
申请号 US20040009831 申请日期 2004.12.10
申请人 KANG SEUNG Y.;AHN SEONGDEOK;KIM CHUL A.;JOUNG MEYOUNG J.;SUH KYUNG S. 发明人 KANG SEUNG Y.;AHN SEONGDEOK;KIM CHUL A.;JOUNG MEYOUNG J.;SUH KYUNG S.
分类号 H01L29/786;G03F7/00;H01L51/00;H01L51/05;(IPC1-7):G03F7/00 主分类号 H01L29/786
代理机构 代理人
主权项
地址
您可能感兴趣的专利