发明名称 DEVICE MANUFACTURING METHOD AND LITHOGRAPHIC APPARATUS
摘要 PROBLEM TO BE SOLVED: To provide a device manufacturing method having high availability and/or productivity, in which moisture is reduced in an atmosphere within a chamber of an exposure device. SOLUTION: A device manufacturing method comprises step for providing a substrate W, providing a projection beam of radiation PB using an illumination system IL, using a patterning means MA to impart the projection beam PB with a pattern in its cross-section, and projecting the patterned beam of radiation PB to a target portion of the substrate W. In the method, at least part of the method is carried out in at least one of chambers 1, 5 and 6, and at least one chemical reagent is supplied to the chambers 1, 5 and 6 for removing water from the chambers 1, 5 and 6. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005167213(A) 申请公布日期 2005.06.23
申请号 JP20040315016 申请日期 2004.10.29
申请人 ASML NETHERLANDS BV 发明人 KOLESNYCHENKO ALEKSEY YURIEVICH;KURT RALPH;SPEE CAROLUS IDA MARIA ANTONIUS
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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