| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a scan test circuit for easy and inexpensive execution of actual operation speed scan test. <P>SOLUTION: The scan test circuit has a forward rotation/backward rotation control circuit that is inserted and connected between a sequence circuit and a combination circuit included in a path to be scan-tested, and makes the scan data outputted from the sequence circuit rotate in the forward and the backward directions, at an arbitrary timing outside the sequential circuit. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
