发明名称 Mask for use in a microlithographic projection exposure apparatus
摘要 A mask ( 20 ) for use in a microlithographic projection exposure apparatus ( 10 ) has a support ( 28 ) on which a pattern of opaque structures ( 32 ) is applied. The intermediate spaces ( 36, 36 ') remaining between the structures ( 32 c) are filled with a liquid or solid dielectric material ( 38, 38 '). This increases the polarisation dependency of the diffraction efficiency, so that the mask can be used as a polarizer.
申请公布号 US2005123840(A1) 申请公布日期 2005.06.09
申请号 US20040984868 申请日期 2004.11.10
申请人 CARL ZEISS SMT AG 发明人 TOTZECK MICHAEL;GRUNER TORALF;HETZLER JOCHEN
分类号 G02F1/13;G03B27/42;G03C5/00;G03F1/00;G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G02F1/13 主分类号 G02F1/13
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