发明名称 Support structure for low-k dielectrics
摘要 A semiconductor device employs a support structure to mitigate damage to dielectric layers having a low dielectric constant (k). The semiconductor device includes at least one inter-level dielectric layer (ILD) comprising a material having a low dielectric constant (k), and at least one support structure disposed within the low-k dielectric layer. The support structure mitigates damage of the semiconductor device by providing a mechanically stable interface between two layers in the semiconductor device.
申请公布号 US2005116345(A1) 申请公布日期 2005.06.02
申请号 US20030726474 申请日期 2003.12.01
申请人 MURTUZA MASOOD 发明人 MURTUZA MASOOD
分类号 A44B19/26;H01L21/768;H01L23/485;H04J13/00;H04L27/26;(IPC1-7):H01L21/476;H01L29/40 主分类号 A44B19/26
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