发明名称 METHOD OF FORMING BARRIER LAYER
摘要 First, a substrate having at least a conducting layer is provided. Then, a CVD process is performed to form the Ti/TiN barrier layer onto the conducting layer. An examination procedure is followed, and if particles are detected in the Ti/TiN barrier layer, then a rework procedure is performed to remove the Ti/TiN barrier layer and to reform a new Ti/TiN barrier layer.
申请公布号 US2005103750(A1) 申请公布日期 2005.05.19
申请号 US20040709552 申请日期 2004.05.13
申请人 CHEN CHING-HUA;CHENG YI-CHUNG 发明人 CHEN CHING-HUA;CHENG YI-CHUNG
分类号 C23F1/26;C23G1/10;H01L21/66;H01L21/768;(IPC1-7):B65D1/00;F16L1/00;B32B1/08;B29D23/00;B29D22/00;C23F1/00;B44C1/22;C03C15/00;C03C25/68 主分类号 C23F1/26
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