发明名称 Maskless micro-ion-beam reduction lithography system
摘要 A maskless micro-ion-beam reduction lithography system is a system for projecting patterns onto a resist layer on a wafer with feature size down to below 100 nm. The MMRL system operates without a stencil mask. The patterns are generated by switching beamlets on and off from a two electrode blanking system or pattern generator. The pattern generator controllably extracts the beamlet pattern from an ion source and is followed by a beam reduction and acceleration column.
申请公布号 US6888146(B1) 申请公布日期 2005.05.03
申请号 US19990289332 申请日期 1999.04.09
申请人 THE REGENTS OF THE UNIVERSITY OF CALIFORNIA 发明人 LEUNG KA-NGO;BARLETTA WILLIAM A.;PATTERSON DAVID O.;GOUGH RICHARD A.
分类号 H01J3/18;(IPC1-7):H01J3/18 主分类号 H01J3/18
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