发明名称 |
Apparatus and method for testing a plurality of semiconductor chips |
摘要 |
A semiconductor chip test system and test method thereof are provided. The system having a plurality of data input/output pins, a tester for inputting/outputting data through the plurality of data input/output pins; a plurality of semiconductor chips to be tested by the tester; a control circuit for sequentially outputting the output data from each of the plurality of semiconductor chips to the tester during a read operation and simultaneously supplying the input data from the tester to the semiconductor chips during a write operation.
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申请公布号 |
US6888366(B2) |
申请公布日期 |
2005.05.03 |
申请号 |
US20030458437 |
申请日期 |
2003.06.10 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM HONG-BEOM;PARK HO-JIN;IN SUNG-HWAN;KIM HA-IL |
分类号 |
G01R31/28;G01R31/3183;G01R31/319;G06F11/273;G11C29/56;H01L21/822;H01L27/04;(IPC1-7):G01R31/26 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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