| 摘要 |
There is disclosed a semiconductor test apparatus enabling writing into an information write space of a block including a failure cell into which block writing is inhibited partially or entirely by the bad block mask function and the fail loop back function. A pattern generation block outputs to an output controller a release signal (S 4 ) for releasing the write inhibit instruction defined by an inhibit signal (S 3 ) and a mask signal (SI). When the output controller receives the release signal (S 4 ), the output controller outputs a write enable signal (WE) to an MUT ( 4 ).
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