发明名称 Method of manufacturing a semiconductor memory with deuterated materials
摘要 A method for manufacturing a MirrorBit(R) Flash memory includes providing a semiconductor substrate and successively depositing a first insulating layer, a charge-trapping layer, and a second insulating layer. First and second bitlines are implanted and wordlines are formed before completing the memory. Spacers are formed between the wordlines and an inter-layer dielectric layer is formed over the wordlines. One or more of the second insulating layer, wordlines, spacers, and inter-layer dielectric layers are deuterated, replacing hydrogen bonds with deuterium, thus improving data retention and substantially reducing charge loss.
申请公布号 US6884681(B1) 申请公布日期 2005.04.26
申请号 US20030672093 申请日期 2003.09.26
申请人 FASL LLC 发明人 KAMAL TAZRIEN;HALLIYAL ARVIND;NGO MINH VAN;RAMSBEY MARK T.;YANG JEAN Y.;SHIRAIWA HIDEHIKO;SUGINO RINJI
分类号 H01L21/336;H01L21/8246;(IPC1-7):H01L21/336 主分类号 H01L21/336
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