发明名称 Via enclosure rule check in a multi-wide object class design layout
摘要 In a multi-wide class design layout, design rule checks for enclosure of multi wide class objects prevent false errors or false passes by performing such checks against the non-virtual boundaries of a wide class object, and not against the virtual boundaries. An exemplary embodiment provides a method for identifying as a violation, for each wide class w<SUB>i </SUB>object, any geometry on another layer which is located at least partially inside the w<SUB>i </SUB>object and has any portion thereof located within a distance encl<SUB>i </SUB>of any non-virtual boundary of the w<SUB>i </SUB>object. The exemplary method is preferably performed using effective wide class objects.
申请公布号 US6883149(B2) 申请公布日期 2005.04.19
申请号 US20020260811 申请日期 2002.09.30
申请人 SUN MICROSYSTEMS, INC. 发明人 LI MU-JING;YANG AMY
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
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