发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To prevent the generation of a stress in a field region, and to prevent the induction of a dislocation in an active region in a semiconductor device. SOLUTION: In a manufacturing method for the semiconductor device, the manufacturing method comprises a step where the insular active region 10 is formed on a support substrate; a step where the field region 20 is formed so as to surround the periphery of the active region 10; a step when an opening section 112 is formed on a boundary between the active region 10 and the field region 20, a step where the field region 20 is treated thermally for discharging a residual evaporating substance after the opening section 112 is formed, and a step where the opening section 112 is oxidized thermally and buried. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005093680(A) 申请公布日期 2005.04.07
申请号 JP20030324554 申请日期 2003.09.17
申请人 OKI ELECTRIC IND CO LTD 发明人 FUJIMAKI HIROKAZU
分类号 H01L21/331;C30B1/00;H01L21/76;H01L21/762;H01L21/86;H01L27/12;H01L29/732;(IPC1-7):H01L21/76 主分类号 H01L21/331
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