发明名称 |
METHOD FOR EXAMINING ORGANIC SEMICONDUCTOR MATERIAL |
摘要 |
PROBLEM TO BE SOLVED: To provide a precise examination method for an organic semiconductor material. SOLUTION: The absorbance of the organic semiconductor material is measured, and the characteristics of an organic semiconductor formed by the organic semiconductor material are evaluated based on the measurement value. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2005091231(A) |
申请公布日期 |
2005.04.07 |
申请号 |
JP20030326760 |
申请日期 |
2003.09.18 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
ARAMAKI SHINJI;KATO JUNICHI |
分类号 |
G01N21/27;C07D487/22;G01N21/33;(IPC1-7):G01N21/27 |
主分类号 |
G01N21/27 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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