发明名称 INSPECTION SOCKET FOR ELECTRONIC COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide an inspection socket for electronic component for surely bringing a contact part into contact with an end face electrode, even if the end face electrode becomes small due to a simple constitution, and obtaining full contact amount for implementing an inspection and an evaluation. SOLUTION: The inspection socket for electronic component has the end face through-hole electrodes 11a provided in a part or all the electrodes of an electronic component 11, an inspection stage 12 having a window 13 provided at a location corresponding to the end face through-hole electrode 11a, and the end-face through-hole contact part 14 provided protrudingly from the window 13 at an end. The end-face through-hole contact part 14 has at least three metering parts 14a, 14b, 14c which move independently. The metering part 14b, disposed at the center protrudes from the window 13 rather than the other metering parts 14a, 14c, and contacts the interior of a through-hole part of the end face through-hole electrode 11a. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2005091195(A) 申请公布日期 2005.04.07
申请号 JP20030325818 申请日期 2003.09.18
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 SHIRAI HIROYUKI
分类号 G01R31/26;G01R1/073;H01R33/76;(IPC1-7):G01R31/26 主分类号 G01R31/26
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