发明名称 Methods and systems for enhanced automated system testing
摘要 Electrical and mechanical components and associated processes for enhancing automated test of a system by permitting automated generation and application (injection) of real-world stimuli applied to the system under test and sensing responses from the system under test without the need for manual intervention. Test components of the present invention may intercede in the exchange of signals and power over various signaling paths within a system under test. Under programmable control by methods of the invention, the electrical components of the present invention may simulate any desired real-world stimulus on any signal path associated with the system under test. Electromechanical manipulation test components and sensor components allow automation of testing of physical aspects of the system under test. Centralized test sequencing and logic enables simpler test components to permit improved scalability and flexibility of the automated test system and processes.
申请公布号 US6876942(B2) 申请公布日期 2005.04.05
申请号 US20020246168 申请日期 2002.09.18
申请人 LSI LOGIC CORPORATION 发明人 HAGEROTT STEVEN G.;LARA JOHN M
分类号 G01R31/28;G01R31/319;(IPC1-7):G06F3/00 主分类号 G01R31/28
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