发明名称 Method of forming a capacitor dielectric layer
摘要 A method of forming a capacitor includes forming first and second capacitor electrodes over a substrate. A capacitor dielectric region is formed intermediate the first and second capacitor electrodes, and includes forming a silicon nitride comprising layer over the first capacitor electrode. A silicon oxide comprising layer is formed over the silicon nitride comprising layer. The silicon oxide comprising layer is exposed to an activated nitrogen species generated from a nitrogen-containing plasma effective to introduce nitrogen into at least an outermost portion of the silicon oxide comprising layer. Silicon nitride is formed therefrom effective to increase a dielectric constant of the dielectric region from what it was prior to said exposing. Capacitors and methods of forming capacitor dielectric layers are also disclosed.
申请公布号 US6875707(B2) 申请公布日期 2005.04.05
申请号 US20030418664 申请日期 2003.04.17
申请人 MICRON TECHNOLOGY, INC. 发明人 MOORE JOHN T.;DEBOER SCOTT J.
分类号 H01L21/02;H01L21/314;(IPC1-7):H01L21/31 主分类号 H01L21/02
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